Name: Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Luogo di origine:

Cina

Marca:

WINNER

Certificazione:

ISO9100

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Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dettagli del prodotto

Nome del prodotto:

sonda di prova a molla

barile:

PB, Palato d'oro

Stantuffo inferiore:

BeCu/SK4, placcato oro

Stantuffo SUPERIORE:

SK4(Be Cu)/Placcato in oro

PRIMAVERA:

SWPB(SUS)/Placcato in oro

Disponibilità:

Dimensioni personalizzate disponibili

Rivestimento:

Oro placcato

Valutazione attuale:

Resistenza di contatto:

100 mAh massimo

Larghezza di banda:

-0,85 dB a 19,6 GHz

induttanza:

1,27nH

Captazione:

1,62pF

Full Actus:

1,0 mm

Corso nominale:

0,65 mm

Forza di molla:

25 grammi @ 0,65 mm

La vita meccanica supera:

200k

Evidenziare:

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Termini di trasporto & di pagamento

Quantità di ordine minimo

3000pcs

Prezzo

999

Imballaggi particolari

Imballaggio neutrica o con logo OEM

Tempi di consegna

5-8 giorni lavorativi

Termini di pagamento

L/C, Western Union, T/T

Capacità di alimentazione

100000 rotoli al mese

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Descrizione di prodotto

High Quality Switch Contact Pin Test Probe YF DE1-051DF57-01C0

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities.

Key Product Features

High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Etichette：

Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

High Quality Brass Spring Loaded 4 Pin PCB Contact Pin for Electronic Device

Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for PCB Testing

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for IC Testing

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